SEMENT ISHLAB CHIQARISH TEXNOLOGIK LINIYALARIDA KO‘P KANALLI O‘LCHOV ASBOBLARINING XALQARO ETALONLAR ZANJIRIGA (SI) METROLOGIK KUZATILUVCHANLIGINI (TRACEABILITY) TA'MINLASH MODELLARI
Keywords:
Kalit so‘zlar: sement sanoati, metrologik kuzatiluvchanlik, SI tizimi, X-RAY tahlili, GUM, VIM, kalibrlash iyerarxiyasi, davlat standart namunalari, O‘zDSt 3410.Abstract
Annotatsiya: Ushbu maqolada zamonaviy sement sanoati korxonalari avtomatlashtirilgan ishlab chiqarish liniyalari va sinov laboratoriyalari sharoitida ko‘p kanalli raqamli o‘lchov vositalarining o‘lchash natijalarini Xalqaro birliklar tizimiga (SI) izchil va uzluksiz metrologik kuzatiluvchanligini (Metrological Traceability) ta'minlash muammolari fundamental tadqiq etilgan. Sement va uning ko'p komponentli xomashyo aralashmalari tarkibini Rentgen-fluorestsent (X-RAY / XRF) va Rentgen fazaviy tahlil (XRD) asboblari yordamida aniqlashda o‘lchash birliklarining milliy va xalqaro etalonlar zanjiri hamda Sertifikatlangan Davlat Standart Namunalaridan (CRM) foydalangan holda uzluksiz kalibrlash iyerarxiyasi modellashtirilgan. Xalqaro GUM va VIM yo‘riqnomalari prinsiplari asosida o‘lchash natijalarining daxldorligi va ko‘p omilli noaniqlik koeffitsiyentlarining transformatsiyasi chuqur tahlil qilingan. Ishlab chiqilgan dinamik metrologik kuzatiluvchanlik modeli sement sanoatida o‘lchashlar ishonchliligini hamda laboratoriyalarning O‘zDSt 3410 talablariga muvofiq texnik vakolatliligini va mahsulot muvofiqlik sertifikatlarini olish jarayonlarini raqamli transformatsiya qilishga xizmat qiladi.
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